公司介绍－珠海真理光学仪器有限公司

公司简介

真理光学仪器有限公司专注于颗粒表征仪器的研发和制造，产品涵盖激光（衍射法）粒度分析仪、动态光散射纳米粒度及Zeta电位分析仪以及颗粒图像分析仪，既有实验室仪器，又有在线检测系统。真理光学秉持“科学态度，工匠精神”，为用户提供粒度产品和服务。

真理光学汇集了以张福根博士为代表的全国颗粒表征领域的人才。张福根博士现任本公司董事长兼首席科学家，还担任全国颗粒表征及分检与筛网标准化技术委员会副主任委员、天津大学兼职教授，曾担任中国颗粒学会副理事长，同时也是“欧美克”字号公司的创始人。曾担任英国某粒度仪器公司中国总经理20余年的秦和义先生担任本公司商务总经理，中国颗粒学会青年理事潘林超博士、陈进博士担纲公司的研发主力。

激光（衍射法）粒度仪虽然已得到广泛应用，但是在很多方面还存在需要改进的地方，不论是科学基础方面，还是技术方案方面。真理光学的团队针对当前市面上仪器存在的不足，展开了系统的理论研究和技术创新，发现了衍射光斑（爱里斑）的反常变化现象（ACAD），解释了为什么不能测量3μm左右的聚苯乙烯微球，并给出了反常区（不能测量粒径）的一般公式；研究了衍射仪器的测量上限和下限；研究了颗粒折射率偏差对测量结果的影响，发明了两种根据散射光分布估算颗粒折射率的方法;提出了斜置梯形窗口技术方案，解决了前向超大角测量盲区的问题，使衍射仪器的亚微米颗粒测量水平得到提高;提出了统一的反演算法（专有技术），消除了不同计算模式给出不同结果的尴尬；设计出了高达20Kfps的超高速并行数据采样电路，使干法测量的精度不亚于湿法测量，对高速喷雾场的测量（时间）分辨率也更高。

在纳米粒度及Zeta电位仪方面，真理光学提出了比相位分析法（PALS）更先进的余弦拟合相位分析法（CF-PALS），用光纤分束取代了传统的平板分束镜分束，用光纤内光干涉取代了自由空间干涉，使Zeta电位的测量重复性大幅度提高。

Linkoptik Instruments specializes in the R&D and manufacturing of particle characterization instruments. Its product portfolio includes laser diffraction particle size analyzers, dynamic light scattering nanoparticle size & zeta potential analyzers, and particle image analyzers, covering both laboratory instruments and online monitoring systems. Adhering to the spirit of “Scientific Attitude and Craftsmanship”, Linkoptik Instruments provides customers with professional particle sizing products and services.

Linkoptik Instruments has brought together top professionals in China’s particle characterization field, led by Dr. Zhang Fugen. Dr. Zhang Fugen currently serves as Chairman and Chief Scientist of the company. He is also Vice Chairman of the National Technical Committee for Standardization of Particle Characterization, Sizing and Sieves, an adjunct professor at Tianjin University, former Vice President of the Chinese Society of Particuology, and founder of the “Oumike (OMEC)” brand.

Mr. Qin Heyi, who served as China General Manager of a British particle size instrument company for more than 20 years, acts as Commercial General Manager of Linkoptik Instruments. Dr. Pan Linchao and Dr. Chen Jin, both young council members of the Chinese Society of Particuology, serve as core members of the company’s R&D team.

Although laser diffraction particle size analyzers have been widely used, they still have room for improvement in both fundamental science and technical design.
Targeting the limitations of existing instruments on the market, the R&D team of Linkoptik Instruments has carried out systematic theoretical research and technological innovation:

Discovered the Abnormal Change of Airy Diffraction pattern (ACAD), explained the difficulty in accurately measuring polystyrene microspheres around 3 μm, and derived a general formula for the invalid measurement size range;
Studied the upper and lower measurement limits of laser diffraction instruments;
Investigated the influence of particle refractive index deviation on measurement results, and developed two methods for estimating particle refractive index based on scattered light distribution;
Proposed an inclined trapezoidal window design to eliminate the large forward-angle measurement blind zone, greatly improving sub-micron particle measurement performance;
Developed a proprietary unified inversion algorithm that removes inconsistencies among results from different calculation models;
Designed an ultra-high-speed parallel data acquisition circuit up to 20,000 fps, enabling dry measurement to achieve accuracy comparable to wet measurement, with higher temporal resolution for high-speed spray field analysis.

For nanoparticle size and zeta potential analyzers, Linkoptik Instruments proposed Cosine Fitting Phase Analysis Light Scattering (CF‑PALS), a more advanced technique than conventional Phase Analysis Light Scattering (PALS). By replacing traditional beam-splitting mirrors with fiber optic beam splitting and replacing free-space interference with in-fiber optical interference, the measurement repeatability of zeta potential has been significantly improved.